The Scanning Electron Microscope (SEM) SU-70 (manufactured by Hitachi, Japan) is a very sensitive research equipment, with field emission, and is based on a Schottky electron source. SU-70 includes several modules required for surface analysis of materials; for processing materials nanolithography (EBL), energy dispersive spectrometry (EDS) and wavelength dispersive spectrometry (WDS). All these modules are attached to the equipment.

Multi EA 4000 is a device used for the determination of carbon (TC, TIC), sulfur (TS) and chlorine (TCl) of solid samples or viscous paste. The operating principle of the device is based on the high-temperature combustion (1000 – 1500 ° C) of samples in oxygen flow. The core of the device is the furnace which provide high temperature necessary for sample decomposition (pyrolysis and combustion oxidation).

Parr 6400 Calorimeter is used to determine the specific heat of the sample, relative to a standard sample heat. The burning is accomplished in metal pressure vessel and controlled atmosphere of oxygen – called “bomb”. The energy released from the combustion is absorbed by the calorimeter and the result – temperature changes – is determined.

Mercur Duo is a device used for the determination of Hg by two methods: atomic absorption (AA) and atomic UV fluorescence (FA). Using these two methods the application range is extend from ng / L (ppt) to mg / L (ppb). Determination of mercury in liquid samples is performed; the samples require prior mineralization using acid mixtures. Mercur Duo is mainly used in water and wastewater laboratories and for environmental analysis.

Multipurpose and multifunctional X-ray diffraction (XRD) system, incorporating a vertical goniometer / (radius: 285 mm), geometry G/9, cross beam optics (CBO) technology for permanently mounted, permanently aligned. Symmetrical and asymmetrical geometries (optical configuration user-selectable): focused high resolution Bragg Brentano geometry, high resolution parallel beam geometry for X-ray reflectivity (XRR) and grazing incidence X-ray diffraction (GIXRD), transmission and reflection SAXS geometry (Small Angle X-Ray Scattering), micro-area X-ray diffraction;

Sequential wavelength dispersive X-ray fluorescence benchtop spectrometer for elemental analysis. PC controlled system, equipped with automatic sampler 12 places (solid and liquid samples accessorized) in vacuum, air or helium atmosphere. System equipped with 3 position crystal changer: LiF (200) for heavy elements (Ti-U), PET and RX 25 for light elements (O-Mg and Al-Sc).

combined with total reliability and ultra-flexibility; innovative RAPID (Right Angle Positive Ion Deflection) lens technology (90° ion optics done right) for separation of ions and neutrals; innovative interface with skimmer cone featuring unique, user-replaceable inserts mounted behind the cone tip to control memory effects; high-performance quadrupole analyzer is pumped by a novel split flow turbo pump backed by a single rotary

high-performance spectrometer, 16k channels with data security system for in-situ analysis; multichannel portable analyzer, detector NaI (Tl) detector (NaI crystal dimensions 3”x3”; energetic resolution max. 7 % at 661 keV); digitally stable: consistent answers for long counts, changing count-rates and temperatures;

FT-IR spectroscopy system for advanced research consists of: FT-IR spectrometer Vertex 80 and high-resolution microscope Hyperion 3000. The system is designed for advanced research activities in various fields: physics of materials, environmental studies, studies of inorganic, organic, macromolecular and pharmacology, molecular and cellular biology, research in ceramics and semiconductor, composites and nanomaterials research, food analysis, study of documents and art objects and other fields.

The instrument is a single beam spectrophotometer, compact and ruggedness. Sample compartment accepts cells from 10 mm to 100mm path length. It is equipped with a LCD display and water-proof touch-sensitive keyboard and allows connection to printer.